AKBAR, Sana; AHMAD, Khawaja Tehseen; ABID, Mhammad Kamran; ASLAM, Naeem. Wheat Disease Detection for Yield Management Using IoT and Deep Learning Techniques. VFAST Transactions on Software Engineering, [S. l.], v. 10, n. 3, p. 80–89, 2022. DOI: 10.21015/vtse.v10i3.1108. Disponível em: https://www.vfast.org/journals/index.php/VTSE/article/view/1108. Acesso em: 23 apr. 2026.